GHOPTO SWIR imaging gigabit camera is based on an in-house developed InGaAs detector with multiple resolutions. The compact GH-SW640-GigE meets requirements of high sensitivity in the SWIR range from 900nm to1700nm and with accompanied by extended wavelength from 400nm to 1700nm options. The short wave infrared camera comes with PAL output and GigE vision interface, supporting 14-bit data transfer and adjustable exposure time. The SWIR Short Wave Infrared GigE/GIG-E vision 2.0 camera offers unique capabilities for various applications in Industrial inspections as nondestructive test, Si wafer inspection, semiconductor circuit detection, laser beam profiling and process monitoring. We also offer 10 GIG-E vision camera as well as USB infrared camera.
PERFORMANCE ADVANTAGES OF GH-SW640-GIGE
01. High-performance Gige network InGaAs camera
02. High dynamic range and high frame rate
03. Automatic on-board image processing
04. Region of interest (ROI) control
05. Single point correction of electronic shutter
06. Optional screen windowing function
TECHNICAL INFORMATION OF GH-SW640-GIGE
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Type
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GH-SW640-GigE
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Array Type
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InGaAs
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FPA Format
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640 x 512
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Spectral Response
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0.9 ~ 1.7 / 0.4 ~ 1.7μm( optional )
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Pixel Pitch
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15μm
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Active Area
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9.6mm x 7.68mm
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Quantum Efficiency
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＞70%（1.0 ~ 1.6μm）
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Frame Rate
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100 Hz
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Integration Type
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snapshot
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Integration Time Range
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50 μs ~ 20 ms /100Hz maximum integral:9ms
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On-board Image Processing
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One/two-point correction、bad pixel replacement、image denoising 、image smoothing, controllable shutter compensation
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Operability
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＞99.5%
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Dynamic Range
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76 dB( linear mode )
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Charge handing capacity
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1.7×104 e-（@HG,1.8V）
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ADC
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14bit
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Analog Output
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PAL、SMA
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Digital Output
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GigE
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Image Acquisition
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GUI / SDK
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Trigger
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Trigger RS485（optional）
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Power Input
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DC 12V
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Power Consumption
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＜4W（noTEC）
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Lens Mount
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C-Mount
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Operating Temperature
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-20 ℃ ~ +50 ℃ / -40 ℃ ~ +60 ℃（optional）
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Storage Temperature
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-40 ℃ ~ +80 ℃
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DRAWING OF GH-SW640-GIGE
